"This book comprises a concise introduction to the fundamental physical concepts of electron microscopy and related analytical techniques … . The concepts are well explained and illustrated, and in addition, the author offers a helpful introduction to microscopy, as a whole … . The text includes interesting historical tidbits and also alludes to more recent developments … . It is suitable for institutional or personal purchase." (Andreas Holzenburg, Microbiology Today, July, 2006)

"R.F. Egerton … has now written a short book for beginners on electron microscopy in general: Physical Principles of Electron Microscopy, an Introduction to TEM, SEM, and AEM[10]. … Extremely simple language is used throughout and newcomers to the subject will be grateful for this text, designed to accompany a one-semester undergraduate course." (P. W. Hawkes, Ultramicroscopy, Vol. 107 (54), 2007)

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.