On behalf of the organizing committee, we would like to welcome you to Darmstadt
and DAGM 2010, the 32nd Annual Symposium of the German Association
for Pattern Recognition.
The technical program covered all aspects of pattern recognition and, to
name only a few areas, ranged from 3D reconstruction, to object recognition
and medical applications. The result is reflected in these proceedings, which
contain the papers presented at DAGM 2010. Our call for papers resulted in 134
submissions from institutions in 21 countries. Each paper underwent a rigorous
reviewing process and was assigned to at least three program committee members
for review. The reviewing phase was followed by a discussion phase among
the respective program committee members in order to suggest papers for acceptance.
The final decision was taken during a program committee meeting
held in Darmstadt based on all reviews, the discussion results and, if necessary,
additional reviewing. Based on this rigorous process we selected a total of 57
papers, corresponding to an acceptance rate of below 45%. Out of all accepted
papers, 24 were chosen for oral and 33 for poster presentation. All accepted papers
have been published in these proceedings and given the same number of
pages. We would like to thank all members of the program committee as well
as the external reviewers for their valuable and highly appreciated contribution
to the community. We would also like to extend our thanks to all authors of
submitted papers; without their contribution we would not have been able to
assemble such a strong program.
This book constitutes the refereed proceedings of the 32nd Symposium of the German Association for Pattern Recognition, DAGM 2010, held in Darmstadt, Germany, in September 2010. The 24 revised full papers and 34 revised poster papers were carefully reviewed and selected from 134 submissions. The papers are organized in topical sections on geometry and calibration, recognition, learning and optimization, applications, motion, low-level vision and features, as well as on surfaces and materials.
