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Transmission Electron Microscopy and Diffractometry of Materials

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Experimental methods for diffraction and microscopy are pushing the front edge of nanoscience and materials science, and important new developments are covered in this third edition. For transmission electron microscopy, a remarkable recent development has been a practical corrector for the spherical aberration of the objective lens. Image resolution below 1?A can be achieved regularly now, and the energy resolution of electron spectrometry has also improved dramatically. Locating and identifying individual atoms inside materials has been transformed from a dream of fifty years into experimental methods of today.

The entire field of x-ray spectrometry and diffractometry has benefited from advances in semiconductor detector technology, and a large community of scientists are now regular users of synchrotron x-ray facilities. The development of powerful new sources of neutrons is elevating the field of neutron scattering research. Increasingly, the most modern instrumentation for materials research with beams of x-rays, neutrons, and electrons is becoming available through an international science infrastructure of user facilities that grant access on the basis of scientific merit.

The fundamentals of scattering, diffractometry and microscopy remain as durable as ever. This third edition continues to emphasize the common theme of how waves and wavefunctions interact with matter, while highlighting the special features of x-rays, electrons, and neutrons. The third edition is not substantially longer than the second, but all chapters were updated and revised. The text was edited throughout for clarity, often minimizing sources of confusion that were found by classroom teaching. There are significant changes in Chapters 1, 3, 7, 8 and 9. Chapter 11 is new, so there are now 12 chapters in this third edition. Many chapter problems have been tuned to minimize ambiguity, and the on-line solutions manual has been updated.

We thank Drs. P. Rez and A. Minor for their advice on the new content of this third edition. Both authors acknowledge support from the National Science Foundation for research and teaching of scattering, diffractometry, and microscopy.
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